mirror of
https://github.com/openhwgroup/cvw
synced 2025-02-03 02:05:21 +00:00
Fixed typos in existing endianness test
This commit is contained in:
parent
e6987524ab
commit
c5cbe43732
@ -1,4 +1,4 @@
|
||||
eeff1122 # Test *** Number: M mode little endian load/store double of 0xaabbccddeeff1122
|
||||
eeff1122 # Test 5.3.2.4: M mode little endian load/store double of 0xaabbccddeeff1122
|
||||
aabbccdd # NOTE: since we're doing a store that matches the width of the load, we cut out all the sign extension
|
||||
eeff1122 # M mode little endian load/store word of 0xaabbccddeeff1122
|
||||
deadbeef # NOTE: the memory was already filled with deadbeef's so subword overwrite some, but not all of them. this is why the values are filled with deadbeefs, rather than 00's or ff's
|
||||
|
@ -30,7 +30,7 @@ INIT_TESTS
|
||||
|
||||
TRAP_HANDLER m
|
||||
|
||||
// Test ***Number: testing that accesses to sub-word memory acceses not on a word boundary go
|
||||
// Test 5.3.2.4: testing that accesses to sub-word memory acceses not on a word boundary go
|
||||
// correctly with the relevant status bit indicating endianness for each mode.
|
||||
// do this by going to each mode with and testing loads with the big endian bit on and off work correctly
|
||||
|
||||
@ -70,7 +70,7 @@ csrs mstatus, x28 // turn on big endianness for M mode
|
||||
|
||||
li x28, 0xAABBCCDDEEFF1122
|
||||
li x29, 0x8000F000
|
||||
sd x28, 0(x29) // value stored in memory as 0x2211FFEECCDDBBAA
|
||||
sd x28, 0(x29) // value stored in memory as 0x2211FFEEDDCCBBAA
|
||||
|
||||
ld x30, 0(x29) // test load double, should read out 0xAABBCCDDEEFF1122
|
||||
sd x30, 0(t1) // test store double, should save 0x2211FFEEDDCCBBAA
|
||||
@ -134,7 +134,7 @@ GOTO_S_MODE
|
||||
|
||||
li x28, 0xAABBCCDDEEFF1122
|
||||
li x29, 0x8000F000
|
||||
sd x28, 0(x29) // value stored in memory as 0x2211FFEECCDDBBAA
|
||||
sd x28, 0(x29) // value stored in memory as 0x2211FFEEDDCCBBAA
|
||||
|
||||
ld x30, 0(x29) // test load double, should read out 0xAABBCCDDEEFF1122
|
||||
sd x30, 0(t1) // test store double, should save 0x2211FFEEDDCCBBAA
|
||||
@ -195,7 +195,7 @@ GOTO_U_MODE
|
||||
|
||||
li x28, 0xAABBCCDDEEFF1122
|
||||
li x29, 0x8000F000
|
||||
sd x28, 0(x29) // value stored in memory as 0x2211FFEECCDDBBAA
|
||||
sd x28, 0(x29) // value stored in memory as 0x2211FFEEDDCCBBAA
|
||||
|
||||
ld x30, 0(x29) // test load double, should read out 0xAABBCCDDEEFF1122
|
||||
sd x30, 0(t1) // test store double, should save 0x2211FFEEDDCCBBAA
|
||||
|
Loading…
Reference in New Issue
Block a user